Education
The LSU Shared Instrumentation Facility (SIF) has become an important resource center for undergraduate and graduate education. Since its inception, major materials research instruments housed within SIF have been used for courses at the mixed senior/graduate level (ME4723, Advanced Materials Analysis) and the graduate level (ME7723, Electron Beam Methods). In these courses, lectures on theory are combined with hands-on individual student practice sessions to introduce students to modern materials characterization techniques, including electron spectroscopy, electron and X-ray diffraction, and electron microscopy.
Undergraduate and graduate students enrolled in ME4723, Advanced Materials Analysis, gather in front of the PANalytical X-ray diffraction system housed within the LSU Shared Instrumentation Facility (SIF). In ME4723, students learn about the principles and laboratory execution of modern materials analysis, including X-ray diffraction (XRD), scanning electron microscopy (SEM), and X-ray photoelectron spectroscopy (XPS).
Dr. Ying Xiao, a staff member of the SIF, directs ME4723 students in a hands-on scanning electron microscopy training session. The LSU SIF has become an important resource center for undergraduate and graduate education in materials science and engineering (MS&E). Professional staff members of the SIF engages students in educational activities in addition to managing SIF resources to fulfill IAM's research mission.
Dr. Dongmei Cao, a staff member of the IAM SIF, introduces XPS instrumentation to ME4723 students. The LSU SIF has become an important resource center for undergraduate and graduate education in materials science and engineering (MS&E). Professional staff members of SIF engages students in educational activities in addition to managing SIF resource to fulfill IAM's research mission.