Spectroscopic Ellipsometry

 

Ellipsometer

J.A. Woollam RC2 Ellipsometer

Ellipsometry measures the change in polarization as the polarized light interacts with the sample structure. The data is then analyzed to determine material properties like film thickness, optical constants, refractive index, etc. The RC2 ellipsometer is a tool with a unique capability of collecting all 16 elements of the Mueller matrix. Mueller matrix SE allows characterization of the most advanced samples and nanostructures.

For information on how to become a user of the NFF and request training for use of the tool, please send an email to Shaloma Malveaux 

To mail in samples for measurements please submit the Thin Film Measurement Request Form

 

 

 

 

 

 

 

irvase

J.A. Woollam  IR-VASE Mark II

The IR -VASE is a spectroscopic ellipsometer that combines the chemical sensitivity of FTIR  spectroscopy with thin film sensitivity of spectroscopic ellipsometry.  This tool covers a wide spectral range from 1.7um - 30um  (333 cm -¹  -  5900 cm -¹)

Features:

  • High Sensitivity to Ultra-Thin Films
  • Non-Destructive Characterization
  • No Baseline or Reference Sample Required
  • Temperature range:  77K - 350°C

For information on how to become a user of the NFF and request training for use of this tool, please send an email to Shaloma Malveaux 

To mail in samples for measurements please submit the Thin Film Measurement Request Form

 

LSU