Spectroscopic Ellipsometer


J.A. Woollam RC2 Ellipsometer

Ellipsometry measures the change in polarization as the polarized light interacts with the sample structure. The data are then analyzed to determine material properties like film thickness, optical constants, refractive index, etc. The RC2 ellipsometer is a tool with a unique capability of collecting all 16 elements of the Mueller matrix. Mueller matrix SE allows characterization of the most advanced samples and nanostructures.

For information on how to become a user of the NFF and request training for use of the tool, please send an email to Shaloma Malveaux, smalvea@lsu.edu

To mail in samples for measurements please submit the Thin Film Measurement Request Form