Nanofabrication Equipment
Lithography
Metrology
- Ellipsometers (UV-NIR and IR)
- Atomic Force Microscope (AFM)
- Scanning Electron Microscope (SEM)
- NIR-UV-VIS Spectrophotometer
- Near- Field Scanning Microscope (neaSNOM)
- Optical Microscope
- Analytic Probe
- Contact Profilometer
- Optical Profilometer
Processing
- Plasma Asher
- Hot Plate Station
- Ovens
- Plasma Etching ( Deep Reactive Ion Etching)
- Rapid Thermal Processing & Annealing (RTA)
- Denton Plasma Coating
- Chemical Hoods
- Wedge Bonder
Deposition