Nanofabrication Equipment
Lithography Equipment
Metrology Equipment
- Ellipsometer
- Reflectometer
- Atomic Force Microscope (AFM)
- Scanning Electron Microscope (SEM)
- NIR-UV-VIS Spectrophotometer
- Measuroscope
- Optical Microscope
- Plasma etching (Deep Reactive Ion Etching)
- Analytic Probe
- Contact Profilometer
- Optical Profilometer