J.A. Woollam RC2 Ellipsometer
Ellipsometry measures the change in polarization as the polarized light interacts with the sample structure. The data are then analyzed to determine material properties like film thickness, optical constants, refractive index, etc. The RC2 ellipsometer is a tool with a unique capability of collecting all 16 elements of the Mueller matrix. Mueller matrix SE allows characterization of the most advanced samples and nanostructures.
For training contact Greshma Nair (225-578-9378)