Atomic Force Microscope (AFM)

afm

Veeco Dimension 3100

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Samples can be handled by the instrument range from small pieces to 150 mm diameter wafers.

Modes: Contact and Tapping mode

For training, contact Greshma at gnair@lsue.edu or 225-578-9378.

 

AFM
Pristine poly(styrene-block-methyl methacrylate) film by Qi Lei, ChE LSU

AFM
Template stripped Silver film by Tiago Ramos Leite da Silva, ChE LSU