Atomic Force Microscope (AFM)
Veeco Dimension 3100
The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Samples can be handled by the instrument range from small pieces to 150 mm diameter wafers.
Modes: Contact and Tapping mode
For training, contact Greshma at firstname.lastname@example.org or 225-578-9378.
Pristine poly(styrene-block-methyl methacrylate) film by Qi Lei, ChE LSU
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